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dc.contributor.authorLucas, Marcelen_US
dc.contributor.authorLeach, Austin M.en_US
dc.contributor.authorMcDowell, Matthew T.en_US
dc.contributor.authorHunyadi, Simona E.en_US
dc.contributor.authorGall, Kenen_US
dc.contributor.authorMurphy, Catherine J.en_US
dc.contributor.authorRiedo, Elisaen_US
dc.date.accessioned2013-01-10T14:31:18Z
dc.date.available2013-01-10T14:31:18Z
dc.date.issued2008-06
dc.identifier.citationLucas, Marcel; Leach, Austin M.; McDowell, Matthew T.; Hunyadi, Simona E.; Gall, Ken; Murphy, Catherine J. and Riedo, Elisa, "Plastic deformation of pentagonal silver nanowires: Comparison between AFM nanoindentation and atomistic simulatios," Physical Review B , 77, 24, (June 2008).en_US
dc.identifier.issn1098-0121 (print)
dc.identifier.issn1550-235X (online)
dc.identifier.urihttp://hdl.handle.net/1853/45721
dc.description© 2008 American Physical Society. The electronic version of this article is the complete one and can be found online at: http://link.aps.org/doi/10.1103/PhysRevB.77.245420en_US
dc.descriptionDOI: 10.1103/PhysRevB.77.245420en_US
dc.description.abstractThe plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 Gpa ) is comparable to the tensile yield strength predicted by atomistic simulations.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectMechanical properties of nanoscale systemsen_US
dc.subjectNanowiresen_US
dc.subjectAtomic force microscopyen_US
dc.titlePlastic deformation of pentagonal silver nanowires: Comparison between AFM nanoindentation and atomistic simulationsen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.publisher.originalAmerican Physical Societyen_US
dc.identifier.doi10.1103/PhysRevB.77.245420en_US


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