Growth direction and morphology of ZnO nanobelts revealed by combining in situ atomic force microscopy and polarized Raman spectroscopy

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Date
2010-01Author
Lucas, Marcel
Wang, Zhong Lin
Riedo, Elisa
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Control over the morphology and structure of nanostructures is essential for their technological applications, since their physical properties depend significantly on their dimensions, crystallographic structure, and growth direction. A combination of polarized Raman _PR_ spectroscopy and atomic force microscopy _AFM_ is used to characterize the growth direction, the presence of point defects and the morphology of individual ZnO nanobelts. PR-AFM data reveal two growth modes during the synthesis of ZnO nanobelts by physical vapor deposition. In the thermodynamics-controlled growth mode, nanobelts grow along a direction close to _0001_, their morphology is growth-direction dependent, and they exhibit no point defects. In the kinetics-controlled growth mode, nanobelts grow along directions almost perpendicular to _0001_, and they exhibit point defects.
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