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dc.contributor.authorSunden, Erik Oscaren_US
dc.contributor.authorWright, Tanya L.en_US
dc.contributor.authorLee, Jung Chulen_US
dc.contributor.authorKing, William P.en_US
dc.contributor.authorGraham, Samuelen_US
dc.date.accessioned2013-04-04T20:16:35Z
dc.date.available2013-04-04T20:16:35Z
dc.date.issued2006-01
dc.identifier.citationSunden, EO and Wright, TL and Lee, J and King, William P. and Graham, Samuel, "Room-temperature chemical vapor deposition and mass detection on a heated atomic force microscope cantilever," Applied Physics Letters, 88, 3, (January 16 2006)en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/1853/46633
dc.description© 2006 American Institute of Physics. The electronic version of this article is the complete one and can be found at: http://dx.doi.org/10.1063/1.2164916en_US
dc.descriptionDOI: 10.1063/1.2164916en_US
dc.description.abstractThis letter reports the localized room-temperature chemical vapor deposition of carbon nanotubes (CNTs) onto an atomic force microscope cantilever having an integrated heater, using the cantilever self-heating to provide temperatures required for CNT growth. Precise temperature calibration of the cantilever was possible and the CNTs were synthesized at a cantilever heater temperature of 800 °C in reactive gases at room temperature. Scanning electron microscopy confirmed the CNTs were vertically aligned and highly localized to only the heater area of the cantilever. The cantilever mechanical resonance decreased from 119.10 kHz to 118.23 kHz upon CNT growth, and then returned to 119.09 kHz following cantilever cleaning, indicating a CNT mass of 1.4×10 ⁻¹⁴ kg. This technique for highly local growth and measurement of deposited CNTs creates new opportunities for interfacing nanomaterials with microstructures.en_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectCarbon nanotubesen_US
dc.subjectChemical vapour depositionen_US
dc.subjectAtomic force microscopyen_US
dc.subjectNanotechnologyen_US
dc.subjectScanning electron microscopyen_US
dc.titleRoom-temperature chemical vapor deposition and mass detection on a heated atomic force microscope cantileveren_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Mechanical Engineeringen_US
dc.publisher.originalAmerican Institute of Physicsen_US
dc.identifier.doi10.1063/1.2164916


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