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dc.contributor.advisorCressler, John D.
dc.contributor.authorHoward, Duane Clarence
dc.date.accessioned2014-05-22T15:26:21Z
dc.date.available2014-05-22T15:26:21Z
dc.date.created2014-05
dc.date.issued2014-02-26
dc.date.submittedMay 2014
dc.identifier.urihttp://hdl.handle.net/1853/51823
dc.description.abstractThe design of reconfigurable microwave and millimeter-wave circuit components and on-chip testing circuitry are demonstrated. These components are designed to enable the mitigation of process faults, aging, radiation effects, and other mechanisms that lead to performance degradation in circuits and systems. The presented work is primarily based on SiGe HBTs in BiCMOS technology and harnesses the inherent resilience of SiGe to mechanisms that degrade transistor performance. However, CMOS FETs are also used in limited applications, such as in the design of switches, op-amps, and DACs. Individual circuit blocks and circuit systems are characterized with the aim of evaluating their performance under nominal conditions as well as in the context of extreme environments and other deleterious phenomena.
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherGeorgia Institute of Technology
dc.subjectMicrowave systems
dc.subjectRF systems
dc.subjectTunable circuits
dc.subjectAutomated testing
dc.subjectBuilt-in-self testing
dc.subjectSelf-healing
dc.subject.lcshIntegrated circuits
dc.subject.lcshMicrowave integrated circuits
dc.subject.lcshElectronic circuits
dc.subject.lcshMicrowave circuits
dc.titleReconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology
dc.typeDissertation
dc.description.degreePh.D.
dc.contributor.departmentElectrical and Computer Engineering
thesis.degree.levelDoctoral
dc.contributor.committeeMemberTentzeris, Manos M.
dc.contributor.committeeMemberPapapolymerou, John
dc.contributor.committeeMemberWang, Hua
dc.contributor.committeeMemberHenry, Todd J.
dc.date.updated2014-05-22T15:26:21Z


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