| dc.contributor.author | Rohatgi, A. | en_US |
| dc.date.accessioned | 2014-10-10T13:09:36Z | |
| dc.date.available | 2014-10-10T13:09:36Z | |
| dc.date.issued | 1989 | en_US |
| dc.identifier.other | 357733 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1853/52466 | |
| dc.description | Issued as Monthly contract management reports [nos. 1-22], Quarterly technical status reports [nos. 1-9], Final technical reports [nos. 1-2], Project E-21-653 | en_US |
| dc.description | Final report has title: Impurity and defect characterization in silicon | en_US |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.relation.ispartofseries | School of Electrical Engineering ; Project no. E-21-653 | en_US |
| dc.subject.lcsh | Silicon | en_US |
| dc.subject.lcsh | Solar cells | en_US |
| dc.title | Impurity characterization support for silicon | en_US |
| dc.title.alternative | Impurity and defect characterization in silicon | en_US |
| dc.type | Technical Report | en_US |
| dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | en_US |
| dc.contributor.corporatename | Georgia Institute of Technology. School of Electrical Engineering | en_US |
| dc.contributor.corporatename | Georgia Institute of Technology. Office of Sponsored Programs | |
