Structure – Process - Property Relationships Governing Solution Processed Semiconductor Performance
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Polymeric semiconductors are promising materials for the commercialization of large‐area, low‐cost and flexible electronics. Their electrical properties are extremely sensitive to structure at multiple length scales, and process modifications can impact calculated hole mobilities by up to four orders of magnitude. For the readily available semiconducting polymer, poly(3‐hexylthiophene) (P3HT), various microstructural features that correlate well with hole mobility have been identified. These include paracrystalline disorder, exciton bandwidth, polymer molecular weight, orientation of crystalline domains, and inter‐grain connectivity. Here, a set of general, robust analysis algorithms will be presented that can be used to statistically quantify two‐dimensional order in microstructures of P3HT‐based OFET devices. Application of these analytical techniques to a variety of shear‐based processing methods indicate that shear‐driven alignment of P3HT fibers can effect substantial improvements in macroscale mobility.
- Nano@Tech Lecture Series