• Login
    View Item 
    •   SMARTech Home
    • Georgia Tech Patents
    • Georgia Tech Patents
    • View Item
    •   SMARTech Home
    • Georgia Tech Patents
    • Georgia Tech Patents
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Secure Communication Using Error Correction Codes

    Thumbnail
    View/Open
    8484545.pdf (546.4Kb)
    Date
    7/9/2013
    Author
    Mclaughlin, Steven William
    Klinc, Demijan
    Kwak, Byung-jae
    Kwon, Dong Seung
    Metadata
    Show full item record
    Abstract
    Systems and methods for selecting a puncturing pattern for a low density parity check (LDPC) code are disclosed. One such method comprises: selecting a puncture pattern distribution for the LDPC code; calculating a security threshold and a reliability threshold for the LDPC, the LDPC having the selected puncture pattern distribution and also described by a degree distribution; storing the selected puncture pattern distribution responsive to a security gap for the LDPC being a lowest value encountered in any prior iterations; selecting another puncture pattern distribution for the LDPC code; and repeating the calculating, the storing, and the selecting another puncture pattern distribution steps.
    URI
    http://hdl.handle.net/1853/56774
    Collections
    • Georgia Tech Patents [1761]

    Browse

    All of SMARTechCommunities & CollectionsDatesAuthorsTitlesSubjectsTypesThis CollectionDatesAuthorsTitlesSubjectsTypes

    My SMARTech

    Login

    Statistics

    View Usage StatisticsView Google Analytics Statistics
    facebook instagram twitter youtube
    • My Account
    • Contact us
    • Directory
    • Campus Map
    • Support/Give
    • Library Accessibility
      • About SMARTech
      • SMARTech Terms of Use
    Georgia Tech Library266 4th Street NW, Atlanta, GA 30332
    404.894.4500
    • Emergency Information
    • Legal and Privacy Information
    • Human Trafficking Notice
    • Accessibility
    • Accountability
    • Accreditation
    • Employment
    © 2020 Georgia Institute of Technology