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dc.date.accessioned2017-05-12T14:26:31Z
dc.date.available2017-05-12T14:26:31Z
dc.date.issued11/18/2014
dc.identifier.urihttp://hdl.handle.net/1853/56939
dc.description.abstractAn apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters (AD converter) that are arranged in parallel to each other to sample an input signal at different frequencies; a plurality of frequency synthesizers configured to provide each AD converter with a different sampling frequency; a signal processor configured to receive an output of the plurality of AD converters to reconstruct the input signal; and/or a controller configured to receive and process a trigger signal.
dc.titleApparatuses For Measuring High Speed Signals And Methods Thereof
dc.typePatent
dc.contributor.patentcreatorKim, Sung Yeol
dc.contributor.patentcreatorChoi, Hyun Woo
dc.contributor.patentcreatorTzou, Nicholas
dc.contributor.patentcreatorWang, Xian
dc.contributor.patentcreatorMoon, Thomas
dc.contributor.patentcreatorChatterjee, Abhijit
dc.contributor.patentcreatorYoo, Ho Sun
dc.identifier.patentnumber8890589
dc.description.assigneeSamsung Electronics Co., Ltd.
dc.description.assigneeGeorgia Tech Research Corporation
dc.identifier.patentapplicationnumber13/770337
dc.date.filed2/19/2013
dc.identifier.uspc327/156
dc.identifier.cpcH03M1/1245
dc.identifier.cpcH03B21/00
dc.identifier.cpcH03M1/121


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