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    Integrated-optic Spectrometer And Method

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    6226083.pdf (530.8Kb)
    Date
    5/1/2001
    Author
    Schwerzel, Robert E.
    Hartman, Nile F.
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    Abstract
    An integrated-optic spectrometer is disclosed for analyzing the composition of light reflected off a sample under analysis. In a simplified embodiment, the spectrometer includes a buffer, located on the top of a substrate, which is etched to create a diffraction grating having grating lines. The diffraction grating and grating lines are formed to provide diffraction of discrete wavelengths of light, while providing for maximum transmission of non-diffracted wavelengths. A waveguide is fabricated on top of the etched buffer through which the reflected light is directed. A photodiode detector array is located above the waveguide into which the diffracted wavelengths are diffracted, providing an analysis of the composition of the reflected light. A clad encompasses the integrated-optic spectrometer, thereby providing protection from outside interference.
    URI
    http://hdl.handle.net/1853/57381
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    • Georgia Tech Patents [1761]

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