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dc.date.accessioned2017-05-12T14:27:38Z
dc.date.available2017-05-12T14:27:38Z
dc.date.issued5/1/2001
dc.identifier.urihttp://hdl.handle.net/1853/57381
dc.description.abstractAn integrated-optic spectrometer is disclosed for analyzing the composition of light reflected off a sample under analysis. In a simplified embodiment, the spectrometer includes a buffer, located on the top of a substrate, which is etched to create a diffraction grating having grating lines. The diffraction grating and grating lines are formed to provide diffraction of discrete wavelengths of light, while providing for maximum transmission of non-diffracted wavelengths. A waveguide is fabricated on top of the etched buffer through which the reflected light is directed. A photodiode detector array is located above the waveguide into which the diffracted wavelengths are diffracted, providing an analysis of the composition of the reflected light. A clad encompasses the integrated-optic spectrometer, thereby providing protection from outside interference.
dc.titleIntegrated-optic Spectrometer And Method
dc.typePatent
dc.contributor.patentcreatorSchwerzel, Robert E.
dc.contributor.patentcreatorHartman, Nile F.
dc.identifier.patentnumber6226083
dc.description.assigneeGeorgia Tech Research Corporation
dc.identifier.patentapplicationnumber09/305391
dc.date.filed5/5/1999
dc.identifier.uspc356/305
dc.identifier.cpcG01J3/0259
dc.identifier.cpcG01J3/18
dc.identifier.cpcG01J3/1895


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