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    Method And Apparatus For Analyzing An Image To Detect And Identify Patterns

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    Date
    11/18/2003
    Author
    Vachtesvanos, George J.
    Dorrity, Lewis J.
    Wang, Peng
    Echauz, Javier
    Mufti, Muid
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    Abstract
    A method and apparatus is provided which analyzes an image of an object to detect and identify defects in the object utilizing multi-dimensional wavelet neural networks. "The present invention generates a signal representing part of the object, then extracts certain features of the signal. These features are then provided to a multidimensional neural network for classification, which indicates if the features correlate with a predetermined pattern. This process of analyzing the features to detect and identify predetermined patterns results in a robust fault detection and identification system which is computationally efficient and economical because of the learning element contained therein which lessens the need for human assistance."
    URI
    http://hdl.handle.net/1853/57507
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    • Georgia Tech Patents [1761]

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