Method And Apparatus For Analyzing An Image To Detect And Identify Patterns
Vachtesvanos, George J.
Dorrity, Lewis J.
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A method and apparatus is provided which analyzes an image of an object to detect and identify defects in the object utilizing multi-dimensional wavelet neural networks. �The present invention generates a signal representing part of the object, then extracts certain features of the signal. These features are then provided to a multidimensional neural network for classification, which indicates if the features correlate with a predetermined pattern. This process of analyzing the features to detect and identify predetermined patterns results in a robust fault detection and identification system which is computationally efficient and economical because of the learning element contained therein which lessens the need for human assistance.�
- Georgia Tech Patents