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dc.date.accessioned2017-05-12T14:28:03Z
dc.date.available2017-05-12T14:28:03Z
dc.date.issued3/8/2005
dc.identifier.urihttp://hdl.handle.net/1853/57563
dc.description.abstractThe present disclosure relates to a method for testing a circuit having analog components. The method comprises performing a low-cost optimized test on the circuit by applying an optimized input stimulus to the circuit, capturing the circuit response to the input stimulus applied to the circuit, evaluating the circuit response to predict whether the performance parameters of the circuit satisfies predetermined specifications for the circuit, and making a pass/fail determination for the circuit based upon the evaluation of the circuit response.
dc.titleMethod For Testing Analog Circuits
dc.typePatent
dc.contributor.patentcreatorVariyam, Pramodchandran N.
dc.contributor.patentcreatorChatterjec, Abhijit
dc.identifier.patentnumber6865500
dc.description.assigneeGeorgia Tech Research Corporation
dc.identifier.patentapplicationnumber09/575488
dc.date.filed5/19/2000
dc.identifier.uspc702/117
dc.identifier.cpcG01R31/01
dc.identifier.cpcG01R31/3163
dc.identifier.cpcG01R31/2846


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