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dc.date.accessioned2017-05-12T14:28:11Z
dc.date.available2017-05-12T14:28:11Z
dc.date.issued4/18/2006
dc.identifier.urihttp://hdl.handle.net/1853/57619
dc.description.abstractSystems and methods for digital-based, standards-compatible, testing of analog circuits embedded inside integrated circuits. In this regard, one such system can be broadly described by a test stimulus generator that transmits a binary-level test-stimulus signal into an analog circuit located inside an integrated circuit; a converter that converts an analog output signal from the analog circuit into a digital output signal; a boundary-scan register chain that transmits the digital output signal out of the integrated circuit, and a test equipment that receives the digital output signal using the IEEE 1149.1 boundary-scan standard and analyzes the digital output signal to compute one or more specifications of the analog circuit located inside the integrated circuit.
dc.titleSystems And Methods For Testing Integrated Circuits
dc.typePatent
dc.contributor.patentcreatorHalder, Achintya
dc.contributor.patentcreatorChatterjee, Abhijit
dc.identifier.patentnumber7032151
dc.description.assigneeGeorgia Tech Research Corporation
dc.identifier.patentapplicationnumber10/292976
dc.date.filed11/13/2002
dc.identifier.uspc714/740
dc.identifier.cpcG01R31/3167


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