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dc.date.accessioned2017-05-12T14:28:23Z
dc.date.available2017-05-12T14:28:23Z
dc.date.issued7/31/2007
dc.identifier.urihttp://hdl.handle.net/1853/57694
dc.description.abstractDevices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and based on their device signatures mapped with the mapping function, dynamic specifications for the second set of data converters can be obtained. Other embodiments are also claimed and described.
dc.titleHigh Speed Data Converter Testing Devices, Methods, & Systems
dc.typePatent
dc.contributor.patentcreatorGoyal, Shalabh
dc.contributor.patentcreatorChatterjee, Abhijit
dc.identifier.patentnumber7250882
dc.description.assigneeGeorgia Tech Research Corporation
dc.identifier.patentapplicationnumber11/368079
dc.date.filed3/3/2006
dc.identifier.uspc341/120
dc.identifier.cpcH03M1/12
dc.identifier.cpcH03M1/1095


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