Scanning Ion Probe Systems And Methods Of Use Thereof
Fedorov, Andrei G.
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Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
- Georgia Tech Patents