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    Scanning Ion Probe Systems And Methods Of Use Thereof

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    7705299.pdf (536.8Kb)
    Date
    4/27/2010
    Author
    Fedorov, Andrei G.
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    Abstract
    Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
    URI
    http://hdl.handle.net/1853/57846
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