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dc.contributor.authorCruickshank, John
dc.date.accessioned2017-07-28T15:38:52Z
dc.date.available2017-07-28T15:38:52Z
dc.date.issued2017-06-28
dc.identifier.urihttp://hdl.handle.net/1853/58440
dc.descriptionPresented on June 28, 2017 at 12:15 p.m. in the Marcus Nanotechnology Building, Room 1116.en_US
dc.descriptionPresented as part of the IEN Industry Seminar Series, "The Future of Advanced Manufacturing".en_US
dc.descriptionJohn Cruickshank is the Solution Architect at Nanotronics Imaging.en_US
dc.descriptionRuntime: 30:43 minutesen_US
dc.descriptionVideos removed from record at the request of the author on 4/9/18.
dc.description.abstractCombining optical microscopy, computational super-resolution, artificial intelligence, and robotics, Nanotronics is bringing the world’s most advanced microscope to every manufacturing sector. We automate industrial microscopes used for inspection of the world's most advanced technologies: semiconductors, microchips, hard drives, LEDs, aerospace hardware, nano-fillers, nanotubes, nano-medicine, and more. Our microscopes are an integrated part of production processes at many of the world's leading manufacturers. Our software is the first industrial application for cognitive artificial intelligence that seamlessly integrates across factories and each stage of production. Nanotronics software detects and classifies nanoscale features with minimal user training. This seminar will focus on the future of advanced manufacturing and how Nanotronics is bringing tools and software to market to help achieve that vision. Central to that vision is the concept of Artificial Intelligence Process Control – a concept that will be enabled through innovation taking place in our labs and from feedback at customer sites that are beginning to transform their production lines with our technology. We plan to address advancements in image analysis software, automation, and a variety of specific use-cases we’ve encountered over the course of the past several years.en_US
dc.format.extent30:43 minutes
dc.language.isoen_USen_US
dc.relation.ispartofseriesIEN Industry Seminar Seriesen_US
dc.subjectCognitive artificial intelligenceen_US
dc.subjectMicroscopeen_US
dc.subjectNanoscaleen_US
dc.titleA Discussion of Practical Applicationsen_US
dc.typePresentationen_US
dc.typeVideoen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Institute for Electronics and Nanotechnologyen_US
dc.contributor.corporatenameNanotronics Imagingen_US


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