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dc.contributor.authorCarter, William
dc.date.accessioned2017-11-14T13:29:15Z
dc.date.available2017-11-14T13:29:15Z
dc.date.issued1992
dc.identifier.urihttp://hdl.handle.net/1853/58932
dc.descriptionIssued as final reporten_US
dc.description.sponsorshipNASA Marshall Space Flight Center,en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesSchool of Materials Science and Engineering ; Project no. E-18-617en_US
dc.subjectElectron spectroscopyen_US
dc.subjectChemistryen_US
dc.subjectAnalyticen_US
dc.titleElectron spectroscopy for chemical analysis : sample analysisen_US
dc.typeTechnical Reporten_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Materials Science and Engineeringen_US


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