• Energy-filtered HREM images of valence-loss electrons 

      Bentley, James; Wang, Z. L. (Zhong Lin) (Georgia Institute of TechnologyEDP Sciences, 1991-12)
      A theory is proposed to include the effects of valence excitations in electron image simulations for high-resolution electron microscopy (HREM) based on the single inelastic scattering model. Under the small thickness ...