• Incoherence effects in reflection electron microscopy 

      Howie, Archie; Lanzerotti, Mary Y.; Wang, Z. L. (Zhong Lin) (Georgia Institute of TechnologyEDP Sciences, 1992-04)
      The phase contrast imaging of surface steps in reflection electron microscopy is analysed. It is shown that the typical images are seriously affected by incoherence effects and that this arises, not from the strong inelastic ...