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    Mechanical behavior and magnetic separation of quasi-one-dimensional SnO₂ nanostructures: A technique for achieving monosize nanobelts/nanowires 

    Jin, Z. Q.; Ding, Yong; Wang, Z. L. (Zhong Lin) (Georgia Institute of Technology, 2005-03-25)
    The as-synthesized nanowires and nanobelts usually have a large size distribution. We demonstrate here a ball milling technique for narrowing the size distribution of oxide nanobelts and nanowires. High-resolution scanning ...
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    Nanoscale mechanical behavior of individual semiconducting nanobelts 

    Mao, Scott X.; Zhao, Minhua; Wang, Z. L. (Zhong Lin) (Georgia Institute of Technology, 2003-08-04)
    Nanobelts are a group of materials that have a rectangle-like cross section with typical widths of several hundred nanometers, width-to-thickness ratios of 5–10, and lengths of hundreds of micrometers. In this letter, ...
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    Integration of metal oxide nanobelts with microsystems for nerve agent detection 

    Yu, Choongho; Hao, Qing; Saha, Sanjoy; Shi, Li; Kong, Xiang Yang; Wang, Z. L. (Zhong Lin) (Georgia Institute of Technology, 2005-01-31)
    We have assembled tin dioxide nanobelts with low-power microheaters for detecting dimethyl methylphosphonate (DMMP), a nerve agent simulant. The electrical conductance of a heated nanobelt increased for 5% upon exposure ...
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    Thermal conductivities of individual tin dioxide nanobelts 

    Shi, Li; Hao, Qing; Yu, Choongho; Mingo, Natalio; Kong, Xiang Yang; Wang, Z. L. (Zhong Lin) (Georgia Institute of Technology, 2004-04-05)
    We have measured the thermal conductivities of a 53-nm-thick and a 64-nm-thick tin dioxide (SnO₂) nanobelt using a microfabricated device in the temperature range of 80–350 K. The thermal conductivities of the nanobelts ...

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    AuthorWang, Z. L. (Zhong Lin) (4)Hao, Qing (2)Kong, Xiang Yang (2)Shi, Li (2)Yu, Choongho (2)Ding, Yong (1)Jin, Z. Q. (1)Mao, Scott X. (1)Mingo, Natalio (1)Saha, Sanjoy (1)... View MoreSubject
    Nanotechnology (4)
    Tin compounds (4)
    Nanostructured materials (3)Nanowires (2)Semiconductor materials (2)Atomic force microscopy (1)Ball milling (1)Bending (1)Dislocation density (1)Electric admittance (1)... View MoreDate Issued2005 (2)2003 (1)2004 (1)Has File(s)Yes (4)
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