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dc.contributor.authorStrike, Timothy M.en_US
dc.contributor.authorShepard, Steven
dc.date.accessioned2006-05-11T19:36:37Z
dc.date.available2006-05-11T19:36:37Z
dc.date.issued1997en_US
dc.identifier.urihttp://hdl.handle.net/1853/9780
dc.descriptionIssued as final reporten_US
dc.descriptionThis item was temporarily removed from SMARTech at the request of the Georgia Tech Research Institute on May 8, 2009.
dc.format.extent15039737 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesGeorgia Tech Research Institute ; Project no. A-5411en_US
dc.subjectRadaren_US
dc.titleManufacturing process testing & analysisen_US
dc.title.alternativeManufacturing process testing and analysisen_US
dc.title.alternativeManufacturing engineering services to improve manufacturing yieldsen_US
dc.title.alternativeIssues and problems in IR image interpretation
dc.typeTechnical Reporteng_US
dc.contributor.corporatenameGeorgia Tech Research Instituteen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs


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