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Cold shield measurements

dc.contributor.authorDetter-Hoskin, Lisaen_US
dc.contributor.authorKnotts, Michael E.
dc.date.accessioned2006-05-11T19:38:29Z
dc.date.available2006-05-11T19:38:29Z
dc.date.issued1998en_US
dc.identifier.urihttp://hdl.handle.net/1853/9806
dc.descriptionIssued as final reporten_US
dc.descriptionThis item was temporarily removed from SMARTech at the request of the Georgia Tech Research Institute on May 8, 2009.
dc.format.extent5799154 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesGeorgia Tech Research Institute ; Project no. A-5729en_US
dc.subjectReflectance Measurementen_US
dc.titleCold shield measurementsen_US
dc.title.alternativeInfrared (3.392 μm) reflectance measurements of cold shields
dc.typeText
dc.contributor.corporatenameGeorgia Tech Research Instituteen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs
dc.type.genreTechnical Report


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