Now showing items 42-42 of 42

    • Withstand Tests: More Than Meets the Eye 

      Hampton, Nigel; Perkel, Josh; Hernandez, J. C.; Begović, Miroslav; Hans, John; Riley, Ron; Tyschenko, Pete; Linte, Christian; Doherty, Frank; Murray, George; Hong, Leeman (Georgia Institute of Technology, 2008-10)