Characterization of advanced electronic and optoelectronic semiconducting materials using synchrontron radiation diffraction imaging for control of crystal growth and fabrication

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/33269

Title: Characterization of advanced electronic and optoelectronic semiconducting materials using synchrontron radiation diffraction imaging for control of crystal growth and fabrication
Author: Stock, S. R. (Stuart)
Description: Issued as Letter, Reports [nos. 1-6], and Final report, Project no. E-18-648
Type: Technical Report
URI: http://hdl.handle.net/1853/33269
Date: 1988
Contributor: Georgia Institute of Technology. Office of Sponsored Programs
Georgia Institute of Technology. School of Materials Engineering
Relation: School of Materials Engineering ; Project no. E-18-648
Publisher: Georgia Institute of Technology
Subject: Semiconductors Effect of radiation on

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