RADC Post-doctoral program

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dc.contributor.author Cox, N. W. (Noah Walter) en_US
dc.date.accessioned 2012-04-26T11:30:16Z
dc.date.available 2012-04-26T11:30:16Z
dc.date.issued 1984 en_US
dc.identifier.other 288153 en_US
dc.identifier.uri http://hdl.handle.net/1853/43373
dc.description Issued as Final report, Project no. A-3498 (subproject of E-21-669/Paris) en_US
dc.publisher Georgia Institute of Technology en_US
dc.relation.ispartofseries Engineering Experiment Station ; Project no. A-3498 en_US
dc.relation.ispartofseries Engineering Experiment Station ; Project no. E-21-669/Paris en_US
dc.subject.lcsh Microwave circuits en_US
dc.title RADC Post-doctoral program en_US
dc.title.alternative Reliability physics of microwave microcircuits en_US
dc.type Technical Report en_US
dc.contributor.corporatename Georgia Institute of Technology. Office of Sponsored Programs en_US
dc.contributor.corporatename Georgia Institute of Technology. Engineering Experiment Station en_US


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