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dc.contributor.authorCox, N. W. (Noah Walter)en_US
dc.date.accessioned2012-04-26T11:30:16Z
dc.date.available2012-04-26T11:30:16Z
dc.date.issued1984en_US
dc.identifier.other288153en_US
dc.identifier.urihttp://hdl.handle.net/1853/43373
dc.descriptionIssued as Final report, Project no. A-3498 (subproject of E-21-669/Paris)en_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesEngineering Experiment Station ; Project no. A-3498en_US
dc.relation.ispartofseriesEngineering Experiment Station ; Project no. E-21-669/Parisen_US
dc.subject.lcshMicrowave circuitsen_US
dc.titleRADC Post-doctoral programen_US
dc.title.alternativeReliability physics of microwave microcircuitsen_US
dc.typeTechnical Reporten_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Engineering Experiment Stationen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs


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