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dc.contributor.authorChang, Yuan Chunen_US
dc.date.accessioned2006-05-01T17:56:45Z
dc.date.available2006-05-01T17:56:45Z
dc.date.issued1953-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/9475
dc.format.extent236 bytes
dc.format.mimetypetext/html
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshYarn Testingen_US
dc.titleA comparative study of yarn variation value measured by electronic tester and by computations from yarn breaking strengthen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentTextilesen_US
dc.description.advisorJ. W. McCarty
dc.identifier.bibid129662en_US


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