Local probe measurement of scattering phenomena from edges and corners

Show full item record

Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/9941

Title: Local probe measurement of scattering phenomena from edges and corners
Author: Schultz, John W. ; Hopkins, Edward J. ; Smith, Glenn ; Peterson, Rickard
Description: Issued as final report This item was temporarily removed from SMARTech at the request of the Georgia Tech Research Institute on May 8, 2009.
Type: Technical Report
URI: http://hdl.handle.net/1853/9941
Date: 2003
Contributor: Georgia Tech Research Institute
Georgia Institute of Technology. Office of Sponsored Programs
Relation: Georgia Tech Research Institute ; Project no. A-6472
Publisher: Georgia Institute of Technology
Subject: Scattering (Physics)
Electromagnetism

All materials in SMARTech are protected under U.S. Copyright Law and all rights are reserved, unless otherwise specifically indicated on or in the materials.

Files in this item

All materials in SMARTech are protected under U.S. Copyright Law and all rights are reserved, unless otherwise specifically indicated on or in the materials.

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show full item record